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[系统管理] 请帮我看一下是不是磁盘坏了 [复制链接]

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发表于 2013-06-27 14:36 |显示全部楼层
这是我用命令#smartctl -a /dev/sda   检测出来的值。请帮我看一下,是不是磁盘坏了。如果是坏了,有什么办法解决?
smartctl 5.39.1 2010-01-28 r3054 [x86_64-unknown-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     Hitachi HUA722010CLA330
Serial Number:    JPW9J0N026069V
Firmware Version: JP4OA3FE
User Capacity:    1,000,204,886,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Thu Jun 27 13:13:05 2013 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84)        Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)        The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection:           (9635) seconds.
Offline data collection
capabilities:           (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities:            (0x0003)        Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability:        (0x01)        Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time:          (   1) minutes.
Extended self-test routine
recommended polling time:          ( 161) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   136   136   054    Pre-fail  Offline      -       92
  3 Spin_Up_Time            0x0007   121   121   024    Pre-fail  Always       -       315 (Average 312)
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       18
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       1
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   138   138   020    Pre-fail  Offline      -       31
  9 Power_On_Hours          0x0012   099   099   000    Old_age   Always       -       8256
10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       14
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       21
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       21
194 Temperature_Celsius     0x0002   193   193   000    Old_age   Always       -       31 (Lifetime Min/Max 23/33)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       1
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 42 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 42 occurred at disk power-on lifetime: 3108 hours (129 days + 12 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 21 1c 03

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 00 00 21 1c 40 00  44d+23:44:07.490  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00  44d+23:44:07.489  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00  44d+23:44:07.488  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00  44d+23:44:07.482  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 00  44d+23:44:07.482  SET FEATURES [Set transfer mode]

Error 41 occurred at disk power-on lifetime: 3108 hours (129 days + 12 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 21 1c 03

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 08 00 21 1c 40 00  44d+23:43:49.180  READ FPDMA QUEUED
  60 10 00 f0 43 c6 40 00  44d+23:43:49.180  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00  44d+23:43:49.179  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00  44d+23:43:49.177  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00  44d+23:43:49.172  IDENTIFY DEVICE

Error 40 occurred at disk power-on lifetime: 3108 hours (129 days + 12 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 21 1c 03

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 10 08 f0 43 c6 40 00  44d+23:43:30.922  READ FPDMA QUEUED
  60 00 00 00 21 1c 40 00  44d+23:43:30.922  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00  44d+23:43:30.921  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00  44d+23:43:30.920  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00  44d+23:43:30.914  IDENTIFY DEVICE

Error 39 occurred at disk power-on lifetime: 3108 hours (129 days + 12 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 21 1c 03

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 10 00 f0 43 c6 40 00  44d+23:43:12.721  READ FPDMA QUEUED
  60 00 30 00 21 1c 40 00  44d+23:43:12.613  READ FPDMA QUEUED
  60 00 28 00 27 1c 40 00  44d+23:43:12.613  READ FPDMA QUEUED
  60 00 20 00 26 1c 40 00  44d+23:43:12.612  READ FPDMA QUEUED
  60 00 18 00 25 1c 40 00  44d+23:43:12.612  READ FPDMA QUEUED

Error 38 occurred at disk power-on lifetime: 3108 hours (129 days + 12 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 21 1c 03

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 38 00 22 1c 40 00  44d+23:42:54.251  READ FPDMA QUEUED
  60 00 30 00 23 1c 40 00  44d+23:42:54.251  READ FPDMA QUEUED
  60 00 28 00 24 1c 40 00  44d+23:42:54.251  READ FPDMA QUEUED
  60 00 20 00 25 1c 40 00  44d+23:42:54.250  READ FPDMA QUEUED
  60 00 18 00 26 1c 40 00  44d+23:42:54.250  READ FPDMA QUEUED

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

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发表于 2013-06-27 15:36 |显示全部楼层
没看出来硬盘有问题

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发表于 2013-06-27 15:49 |显示全部楼层
啊,没问题?那为什么有42个error?
回复 2# chenyx


   
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